The Bruker Dimension Icon is a state-of-the-art Atomic Force Microscope (AFM) for precise imaging and measurement of topography, mechanical, and electrical properties with atomic-level resolution. It achieves this Angstrom-level resolution through a closed-loop scanner integrated with temperature-compensating sensors that scans with minimal imaging distortion.
Operational Modes: tapping, PeakForce tapping, and contact
X-Y Scan Range: 90µm x 90µm
Z Scan Range: 10µm
Substrates Size: small pieces to 200mm in diameter
