The Bruker DektakPro Surface Profiler is a cutting-edge stylus profiler designed for high-resolution surface characterization across a wide range of materials and applications. This profiler can achieve single nanometer vertical resolution with its advanced sensor technology and closed-loop control.
Technique: Contact measurement
Measurement Modes: 2D/3D profiling, stress analysis, and automated mapping
Substrate Size: Up to 200mm
Max Sample Thickness: 50mm
Stylus Force: 1mg – 15mg
Step Height Range: 5nm – 1mm
Available Styli: 2.5um, 12.5um, and 50um
Scan length range: 55 mm
Data points per scan: up to 120,000
