The Microsanj NT220 Thermoreflectance Imaging Analyzer is an in-situ non-contact measurement of Joule heating-induced thermal transients, for characterization of nonlinear I-V-T dynamics. Direct observation of coupled electro-thermal nonlinear device dynamics.
✓ 4 Mpixel CCD camera temporal and spatial resolution: <20 ns and <400 nm across 28 µm field of view
✓ Piezo autofocus stage compensation of thermal expansion and drift yields
✓ 0.1 °C thermal resolution
✓ IR to UV characterization with 780, 530, 470, and 365 nm pulsed LED illumination
✓ Simultaneous I-V-T characterization through synchronization with external apparatus to probe across steady-state, dynamic, and frequency domain regimes
If interested in this instrument, please directly reach out to Prof. Suin Yi ([email protected])
